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Abstract We propose a new observable for the measurement of the forward–backward asymmetry $$(A_{FB})$$ ( A FB ) in Drell–Yan lepton production. At hadron colliders, the $$A_{FB}$$ A FB distribution is sensitive to both the electroweak (EW) fundamental parameter $$\sin ^{2} \theta _{W}$$ sin 2 θ W , the weak mixing angle, and the parton distribution functions (PDFs). Hence, the determination of $$\sin ^{2} \theta _{W}$$ sin 2 θ W and the updating of PDFs by directly using the same $$A_{FB}$$ A FB spectrum are strongly correlated. This correlation would introduce large bias or uncertainty into both precise measurements of EW and PDF sectors. In this article, we show that the sensitivity of $$A_{FB}$$ A FB on $$\sin ^{2} \theta _{W}$$ sin 2 θ W is dominated by its average value around the Z pole region, while the shape (or gradient) of the $$A_{FB}$$ A FB spectrum is insensitive to $$\sin ^{2} \theta _{W}$$ sin 2 θ W and contains important information on the PDF modeling. Accordingly, a new observable related to the gradient of the spectrum is introduced, and demonstrated to be able to significantly reduce the potential bias on the determination of $$\sin ^{2} \theta _{W}$$ sin 2 θ W when updating the PDFs using the same $$A_{FB}$$ A FB data. 

Abstract The semiconductor tracker (SCT) is one of the tracking systems for charged particles in the ATLAS detector. It consists of 4088 silicon strip sensor modules.During Run 2 (2015–2018) the Large Hadron Collider delivered an integrated luminosity of 156 fb -1 to the ATLAS experiment at a centre-of-mass proton-proton collision energy of 13 TeV. The instantaneous luminosity and pile-up conditions were far in excess of those assumed in the original design of the SCT detector.Due to improvements to the data acquisition system, the SCT operated stably throughout Run 2.It was available for 99.9% of the integrated luminosity and achieved a data-quality efficiency of 99.85%.Detailed studies have been made of the leakage current in SCT modules and the evolution of the full depletion voltage, which are used to study the impact of radiation damage to the modules.